- All sections
- G - Physics
- G01Q - Scanning-probe techniques or apparatus; applications of scanning-probe techniques, e.g. scanning-probe microscopy [spm]
- G01Q 60/16 - Probes, their manufacture or their related instrumentation, e.g. holders
Patent holdings for IPC class G01Q 60/16
Total number of patents in this class: 49
10-year publication summary
|
3
|
2
|
3
|
5
|
10
|
3
|
5
|
4
|
2
|
2
|
| 2015 | 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| The Regents of the University of California | 18943 |
5 |
| Tiptek, LLC | 4 |
3 |
| Centre National de La Recherche Scientifique | 9632 |
2 |
| Hamamatsu Photonics K.K. | 4161 |
2 |
| National Taiwan University | 1140 |
2 |
| Samsung Electronics Co., Ltd. | 131630 |
1 |
| International Business Machines Corporation | 60644 |
1 |
| Hitachi High-Tech Science Corporation | 326 |
1 |
| Olympus Corporation | 13667 |
1 |
| Wisconsin Alumni Research Foundation | 3774 |
1 |
| Board of Regents, The University of Texas System | 5370 |
1 |
| The Regents of the University of Michigan | 4409 |
1 |
| Shimadzu Corporation | 5791 |
1 |
| Japan Science and Technology Agency | 1564 |
1 |
| Anton Paar GmbH | 180 |
1 |
| Board of Trustees of Michigan State University | 1141 |
1 |
| Bruker Nano, Inc. | 334 |
1 |
| Ecole Polytechnique | 308 |
1 |
| Forschungszentrum Julich GmbH | 604 |
1 |
| Fudan University | 585 |
1 |
| Other owners | 20 |